Spectroscopy and Measurement
Spectroscopy is an invaluable tool to study the chemical and electronic structure of surfaces. Scanwel is privileged to have a strong portfolio of techniques, based on irradiation of the sample with X-Rays, UV light, electrons and ions.
Surface sensitive spectroscopic methods, like Auger Electron Spectroscopy (AES), Low Energy Ion Scattering (LEIS) and especially X-ray or UV excited Photoelectron Spectroscopy (XPS and UPS) and Time of Flight SIMS (TOF-SIMS) are powerful tools to characterise the surface chemical composition, the chemical state of the surface electrons and the electronic properties of materials surfaces. Scanwel is pleased to provide expert advice in the sales of these techniques and other measurement such as nanoindentation and quantum transport measurement in collaboration with our partners from leading companies such as SPECS and IONTOF. Since these techniques are mostly vacuum-based our knowledge of vacuum systems and component integration enables us to provide our customers with the best service.