The latest microscopes are constantly developing to provide improved spatial resolution. However, a consequence of working at small length scales, these systems are susceptible to their operating environment, and in particular to vibration caused by other instruments, machinery and traffic movement etc.
Scanwel offers a variety of isolation solutions, from lightweight table-top solutions through to multi-point systems to support the corners of the frame for a whole microscope system.
Applications for vibration isolation
- Scanning probe microscopy (both UHV and ambient table top systems)
- Electron microscopes (SEM, TEM)
- Precision weighing balances / scales
- IVF and life science
- Precision measurement tools
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