Microscopy chemical imaging

Imaging and mapping techniques

While imaging a sample to understand the surface structure and morphology at different length scales is fundamental to microscopy, for a full understanding of a surface it is often desirable to have information on the chemical composition. A variety of surface spectroscopy techniques in the Scanwel portfolio also have imaging capabilities to address this need.

These include X-Ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), Time of Flight SIMS (TOF-SIMS) in vacuum, and multi-technique SPM in ambient conditions. Common functionality in these techniques include a probe beam (X-Rays, Ions, electrons etc) being scanned across the sample (either by moving the beam or the sample) and measurement of the resulting signal.

Microscopy chemical imaging
Microscopy imaging techniques

Key partners and products

SPECS-XPS and AES systems with imaging capability
NT-MDT-multi-technique SPM

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