Imaging and mapping techniques

While imaging a sample to understand the surface structure and morphology at different length scales is fundamental to microscopy, for a full understanding of a surface it is often desirable to have information on the chemical composition. A variety of surface spectroscopy techniques in the Scanwel portfolio also have imaging capabilities to address this need.

These include X-Ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), Time of Flight SIMS (TOF-SIMS) in vacuum, and multi-technique SPM in ambient conditions. Common functionality in these techniques include a probe beam (X-Rays, Ions, electrons etc) being scanned across the sample (either by moving the beam or the sample) and measurement of the resulting signal.