High-quality Scanning Probe Microscopes
In Scanning Probe Microscopy, the perfect instrument is only half of the story. The probe is equally important. We offer a wide assortment of SPM probes, ranging from outine silicon and polysilicon cantilevers ultra-sharp diamond-like carbon tips. probes with different coatings for magnetic measurements, probes for SNOM and many others. To keep your instrument properly calibrated, we supply an extensive array of multiple calibration gratings as well as test samples with free deconvolution software. A range of substrates and test samples for SPM completes our product range.
We partner with NT-MDT, AFM Workshop and IONTOF (Nanoscan) as exclusive distributors for the UK and Ireland.
We supply NT-MDT, Tips Nano and Scan-Sens probes and accessories.
• Wide range of AFM probes for different modes and applications
• Variety of individual calibration standards sold individually and in sets
• Large choice of HOPG sizes, thicknesses and grades