Scanwel Microscopy Solutions

Scanwel offers a wide range of high-end solutions to visualise the surfaces of materials at high resolution, whether it be within a vacuum environment, under controlled atmospheric conditions, in liquid or in air.

The products in our portfolio include various types of Scanning probe microscopy as well as chemical contrast techniques, such as Time of Flight Secondary-Ion Mass Spectrometry (TOF-SIMS), X-Ray and Auger Photoelectron Spectroscopy imaging (XPS, AES).

In addition, we can offer specialist imaging techniques, such as Low Energy Electron Microscopy (LEEM) and momentum microscopy, to give information on the electronic structure of a sample.

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